Optical measurement of target-light waveform
US6541951B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 11, 2001 |
| Grant date | Apr 1, 2003 |
| Priority date | — |
| Expiry date | Apr 8, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/0795
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A method for measuring the waveform of light is provided, which makes it possible to synchronize easily the phase of sampling light with the phase of target light even if the target light is ultra-high speed pulsed light and is transmitted by way of long transmission channel, and to measure the waveform of target light with sufficient time resolution in real time. The method comprises the steps of: (a) generating sampling light having a pulse width sufficiently narrower than that of the target light from the target light; a repetition frequency of the sampling light having a constant difference with respect to a repetition frequency of the target light; (b) supplying the sampling light and the target light to a nonlinear optical member to generate cross-correlated light between the sampling light and the target light; and (c) measuring waveform of the target light based on the cross-correlated light. Preferably, the step (a) comprises the substeps of (a-1) extracting clock light from the target light; the clock light being synchronized with the target light; (a-2) generating an electrical clock signal from the clock light; (a-3) generating an electrical driving signal in such a way…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.