Patent · US Expired

Method of three-dimensionally measuring object surfaces

US6542250B1 · kind B1 · utility

33Cited by
2References
12Claims
0Family size

Inventors

Key dates

Filing dateJun 21, 2000
Grant dateApr 1, 2003
Priority date
Expiry dateJul 17, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30164
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of optically measuring a three-dimensional surface by sequentially projecting predetermined patterns onto the surface to generate thereon a predetermined number of temporary images of different intensities. Each of the images is recorded by sensors of at least two matrix cameras and grey values are determined in a pixel by pixel manner of those images. A first approximation value is determined for calculating a first measuring point on the surface, and coordinates of this approximation value are associated on the sensor surfaces of both camera. The grey values of the images of each camera at the positions of the projected points are determined by subpixel interpolation, and a pair of grey scale gradation is detected therefrom. These steps may be repeated until a measuring point is determined by a pair of grey scale gradations analyzed to be similar.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.