Apparatus for determining the crystalline and polycrystalline materials of an item

US6542578B2 · kind B2 · utility

Assignee

• Heimann Systems GmbH · DE

Inventors

• Hermann Ries · Taunusstein, DE
• Patricia Schall · Darmstadt, DE
• Frank Cordes · Neustadt, DE
• Martin Hartick · Bad Nauheim, DE

Key dates

• Filing date: May 16, 2001
• Grant date: Apr 1, 2003
• Expiry date: May 16, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N23/20
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A diffraction apparatus (10) for determining crystalline and polycrystalline materials of an item in objects, preferably in luggage, having a collimation/detector arrangement (11) and an X-ray source (12) and which is mounted to be adjustable in an X-ray testing machine (13). The collimation/detector arrangement (13) is adjustable in height relative to the X-ray source (12), and the two are also laterally and synchronously adjustable via respective adjustment elements (5,6). The collimator (13) has a conically-expanding round slot (15), which simulates a predetermined angle (&THgr;M) of a scatter-beam path.