Patent · US Expired

Multi-environment testing with a responder

US6543034B1 · kind B1 · utility

4Cited by

15References

23Claims

0Family size

Assignee

KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

Lonnie C. Goff · Tempe, US
Brian Logsdon · Glendale, US
Edward M. Petryk · Phoenix, US

Key dates

Filing date	Nov 30, 2001
Grant date	Apr 1, 2003
Priority date	—
Expiry date	Nov 30, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/33
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Among the embodiments of the present invention is test equipment (440) to test an integrated circuit (420). The integrated circuit (420) includes one or more processors and one or more communication devices (130). The test equipment (440) includes a responder integrated circuit (450) that has at least one processor, several communication devices (160), and one or more configuration connections (192). The responder integrated circuit responds to commands from the first integrated circuit (420) and a configuration established with the one or more configuration connections (192) to test operation of the one or more communication devices (130).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.