Patent · US Expired

Scanning probe microscope with probe integrated in an optical system

US6545263B2 · kind B2 · utility

2Cited by
9References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 6, 1998
Grant dateApr 8, 2003
Priority date
Expiry dateNov 6, 2018

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y35/00
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

An illumination device for a light microscope comprises a scanning microscope probe which is integrated in the center thereof. A scanning probe microscope comprising such illumination device is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.