Residual frequency effects compensation
US6545550B1 · kind B1 · utility
Inventor
Key dates
| Filing date | Apr 13, 2001 |
| Grant date | Apr 8, 2003 |
| Priority date | — |
| Expiry date | Jul 5, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03L7/18
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A means is provided to estimate the amount of frequency deviation experienced in a precision resonator resulting from the effects of previous thermal history, acceleration, or aging by determining the differential effect of the perturbing condition on different resonant modes in the same resonator or on different resonators exposed to the same environment. The measurements may be made simultaneously, or sequentially against an independent frequency source. Residual frequency hysteresis effects may be determined in connection with an independent temperature sensor if the exact temperature in not known.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.