Integrated circuit analysis and design involving defective circuit element replacement on a netlist
US6546514B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 1999 |
| Grant date | Apr 8, 2003 |
| Priority date | — |
| Expiry date | Dec 13, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318342
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of operating on a net-list describing an integrated circuit design for use with an automated test pattern generator for testing an integrated circuit built using the design is described. The method includes replacing a defective portion of the design in test mode with a substitute circuit to reduce testing impact of the defective portion. The method includes identifying a first defective portion of the integrated circuit design in the net-list, determining conditions under which the first defective portion is likely to malfunction and replacing the first defective portion in the net-list with another first portion that provides unknown output signals representing an unknown state in response to conditions under which the first defective portion is likely to malfunction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.