Interferometric filter wavelength meter and controller
US6549548B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2001 |
| Grant date | Apr 15, 2003 |
| Priority date | — |
| Expiry date | Aug 11, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0617
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A wavelength measurement system uses birefringent material waveplate, thereby producing a substantially sinusoidal spectral response. As a result, the responses of multiple birefringent filters can be combined to yield a filter system with a periodic frequency response that has an additive wavelength resolution that is spectrally stable. That is, the wavelength measurement system does not have regions where wavelength resolution is degraded. In one implementation, a waveplate system 112 is used, placed between two blocks of birefringent material 110 and 114. A quadrant detector 116 is used to detect the intensities of the resulting four beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.