Patent · US Expired

Expert analysis modules for machine testing

US6549869B1 · kind B1 · utility

29Cited by
14References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 20, 2000
Grant dateApr 15, 2003
Priority date
Expiry dateOct 26, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01H1/003
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A hand-held apparatus gathers and analyzes test data associated with rotating electric machines, where the test data is indicative of one or more operational characteristics of the mechanical equipment. The apparatus, which is operable to be carried by an operator from one machine to another along a test route, includes a sensor input port for receiving a sensor signal from a sensor, where the sensor signal is indicative of one or more operational characteristics of the rotating electric machines. The apparatus also includes a signal conditioning circuit for receiving the sensor signal, and for conditioning the sensor signal to produce a conditioned signal which is appropriate in format to be digitally processed. A processor, which is coupled to the signal conditioner, receives and processes the conditioned signal according to processing instructions and processing parameters to produce a test spectrum. The processing parameters determine one or more characteristics of the test spectrum. A memory device, which is coupled to the processor, stores a plurality of executable test expert modules, each containing the processing instructions for processing the conditioned signal in a part…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.