Method for conducting sensor array-based rapid materials characterization
US6553318B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 15, 2001 |
| Grant date | Apr 22, 2003 |
| Priority date | — |
| Expiry date | May 15, 2021 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC40B40/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is disclosed a material characterization method. The method may include any combination of several potential steps. According to one of the steps multiple material samples are applied to multiple sensors in an array of sensors. In another step, one or more of the sensors of the array are electrically contacted. In another step, electrical connections are formed between selected sensors and electronic test and measurement apparatus. In another step, electric signals are sent to and received from the sensors in the array wherein the signals correspond to thermal, electrical, mechanical or other properties of the material samples. Preferably, some of the equipment (e.g., the electrical connections) used in the method are standardized to allow equipment such as sensor arrays to be interchangeable with equipment such as the electronic test and measurement apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.