Patent · US Expired

Body contact silicon-on-insulator transistor and method

US6555446B1 · kind B1 · utility

6Cited by
5References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 19, 2000
Grant dateApr 29, 2003
Priority date
Expiry dateMar 9, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/378

Abstract

A method for fabricating a body contact silicon-on-insulator transistor (10) includes forming a semiconductor substrate (12) over an insulator (14) and lightly doping the semiconductor substrate (12) to form a body region (18). The method also includes forming a gate (20) over the semiconductor substrate (12) and separated from the semiconductor substrate (12) by a gate insulator layer (21). The gate (20) defines a source region (22), a drain region (24) and a contact region (26). The method also includes masking a portion (36) of the gate (20) and the contact region (26) and heavily doping the source region (22), the drain region (24) and an unmasked portion (36) of the gate (20) with a material having a conductivity substantially opposite a conductivity of the body region (18).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.