Measurement of grooves and long waves on rails with a longitudinal streak of light

US6556945B1 · kind B1 · utility

Assignee

• STN ATLAS Elektronik GmbH · DE

Inventors

• Hubert Burggraf · Oyten, DE
• Rolf Kettenburg · Oyten, DE
• Andreas Krupp · Langwedel, DE
• Dirk Maiwald · El Paso, US
• Dirk Rathjen · Bremen, DE

Key dates

• Filing date: Mar 7, 2000
• Grant date: Apr 29, 2003
• Expiry date: Mar 7, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/8901
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system for measuring unevenness formed by grooves and/or long waves in a surface of an object by using a measuring platform. The system moves the object and the measuring platform relative to each other and projects from the measuring platform a light streak that extends in a direction of the movement onto a surface of the object at a fixed projection angle that is tilted relative to a surface normal of the surface. The light streak is reproduced on a planar, position-sensitive photo receiver with a plurality of successive instantaneous exposures of the photo receiver, where the photo receiver is fixedly arranged on the measuring platform with a recording angle that is tilted relative to the fixed projection angle. The system records the surface along the direction of the movement with a plurality of continuous light-streak images and determines a surface profile of the surface along the direction of the movement from deformations in the plurality of the light-streak images.