Patent · US Expired

Programmable interconnect for semiconductor devices

US6559544B1 · kind B1 · utility

6Cited by
9References
10Claims
0Family size

Inventors

Key dates

Filing dateMar 28, 2002
Grant dateMay 6, 2003
Priority date
Expiry dateMar 28, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A structure for selectively programming interconnections between an input contact and an output contact segment in a multilayer semiconductor, comprising a first group of metal segments each being formed on successive layers of the semiconductor and being interconnected by vias, the first group including the output contact segment; a second group of metal segments each formed on successive layers of the semiconductor and being interconnected by vias, the second group including the input contact segment; and means for connecting a metal segment in the first group to a metal segment in a corresponding layer in the second group, thereby connecting the input contact to the output contact.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.