Patent · US Expired

Three-dimensional (3-D) coordinate measuring method, 3-D coordinate measuring apparatus, and large-structure building method

US6559931B2 · kind B2 · utility

55Cited by
2References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 20, 2002
Grant dateMay 6, 2003
Priority date
Expiry dateSep 20, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C11/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A 3-D coordinate measurement is performed in such a way that an electrooptical distance-measuring device is used to measure a linear distance to a target point set on a surface of a measurement object, an angle measuring device is used to measure shifted angles of an optical axis of the electrooptical distance-measuring device, and a 3-D coordinate of the target point is measured according to a measured distance and a measured angle after the optical axis of the electrooptical distance-measuring device has been aligned to the target point. The present method includes a coordinate recognizing step for observing a plurality of targets, recognizing a plurality of target points, and calculating approximate 3-D coordinates of the target points; a macroscopic sighting step for approximate aligning the optical axis of the electrooptical distance-measuring device; and a microscopic sighting step for aligning the optical axis of the electrooptical distance-measuring device to the one of the target points in the predetermined viewfield range.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.