Method and apparatus to minimize effects of ASE in optical measurements
US6559946B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 15, 2001 |
| Grant date | May 6, 2003 |
| Priority date | — |
| Expiry date | Nov 15, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/331
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for minimizing the effects of noise when measuring a response of a device under test to laser light. Laser light provided from a laser source is provided to an interferometer, which splits the source laser light into a first laser light portion and a second laser light portion and then interferometrically combines the first laser light and the second laser light, resulting in a time-varying interference modulated test laser light and a time-varying interference modulated reference laser light. The time-varying interference modulated test laser light is propagated to a device under test so as to cause the device under test to propagate responsive time-varying interference modulated test laser light. The responsive time-varying interference modulated test laser light is converted to an responsive amplitude modulated electrical test signal, which is high pass filtered. The high pass filtered signal is then demodulated so as to produce a time-varying electrical signal that represents the responsive time-varying interference modulated test laser light propagated by the device under test in response to the time varying interference modulated test laser light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.