Method and apparatus for characterizing laser modules
US6560255B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 24, 2000 |
| Grant date | May 6, 2003 |
| Priority date | — |
| Expiry date | Mar 24, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/0014
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A laser module characterization apparatus and method, the apparatus controlled by a computer, the apparatus having a laser module, an internal etalon transducer, an external etalon, and an external etalon transducer. The laser module comprising a laser source substantially simultaneously emitting a pair of substantially identical beams of light and an internal etalon adapted to receive a first of the pair of beams of light and to permit a portion of the first beam to pass through the internal etalon. The internal etalon transducer connected to the computer and responsive to the portion of the first beam. The external etalon adapted to receive a second of the pair of beams of light and to permit a portion of the second beam to pass through the external etalon. The external etalon transducer connected to the computer and responsive to the portion of the second beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.