Advanced production test method and apparatus for testing electronic devices
US6563301B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 30, 2001 |
| Grant date | May 13, 2003 |
| Priority date | — |
| Expiry date | Apr 30, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An advanced process for moving a Device under Test (DUT) from surface mount to completion and shipping. The process takes a raw populated Printed Circuit Board (PCB) panel or similar article of manufacture and conducts all possible solder, electrical, boundary scan and flashed self-testing. Individual panels are routed out of larger panels and placed into basic electronic device chassis on a motorized and power delivering fixture carrying a fixture adapter to interface with the electronic device. Power is provided as soon as is feasible in order to leverage the DUTs ability to facilitate it's own functional certification. Without power, the “wake-up” time for an electronic device may be extensive. Additionally, the addition of power would otherwise have to be done numerous times throughout the process. Conditions for impending measurement can be set up on a powered electronic device so that measurements may be made the moment the testing instrumentation is ready to take measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.