Eddy current inspection probe
US6563307B2 · kind B2 · utility
6Cited by
4References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2001 |
| Grant date | May 13, 2003 |
| Priority date | — |
| Expiry date | Aug 3, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eddy current inspection probe for inspecting a preselected surface. The eddy current inspection probe includes an expandable element at least partially defining an interior space which is expandable by introducing a pressurized fluid into the interior space from a collapsed position to an expanded position for contacting the preselected surface of the component for inspecting the surface. The probe also includes an eddy current array positioned over the expandable element for generating and detecting magnetic fields in the component to inspect the preselected surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.