Patent · US Expired

Interferometric alignment device

US6563592B2 · kind B2 · utility

2Cited by
12References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 2001
Grant dateMay 13, 2003
Priority date
Expiry dateJun 26, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The interferometric alignment device is a small, compact device that can be attached to any two optical instruments that need to be aligned precisely in both pitch and yaw angles. The device utilizes light reflecting from mirrors that are permanently mounted inside the instruments, one mirror in each of the instruments. The reflected light beams exit their respective instruments via a window built into the frame of the instrument and re-enters the attached alignment device wherein they combine to form an interference pattern. The operator of the alignment device observes the fringes of this pattern and adjusts the azimuth and elevation of one instrument relative to the other instrument until the fringes are at an acceptable minimum number or are eliminated altogether.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.