X-ray examination apparatus
US6563909B2 · kind B2 · utility
13Cited by
5References
3Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 20, 2000 |
| Grant date | May 13, 2003 |
| Priority date | — |
| Expiry date | Dec 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/04
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The invention relates to an X-ray examination apparatus which includes an X-ray source, an X-ray detector, absorption means arranged between the X-ray source and the X-ray detector, a control unit for adjusting the absorption degree of the absorption means, an image processing unit and a display unit. In order to perform an automatic adjustment of the absorption means, the absorption degree therein is optimized in dependence on user-specific parameters (r) and/or apparatus-specific parameters (s) and/or structure parameters (C) and/or parameters (r) classifying the subject matter of the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.