Ion trap mass spectrometry and apparatus
US6566651B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 12, 2002 |
| Grant date | May 20, 2003 |
| Priority date | — |
| Expiry date | Aug 12, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/42
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A laser-cooled fluorescence mass spectrometry apparatus includes an ion trap for trapping sample ions, laser-cooled ions, and probe ions therein; a first irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a first laser beam for cooling the ions; a second irradiating device for irradiating the sample ions, the laser-cooled ions, and the probe ions in the ion trap with a second laser beam for detecting temperature changes in the ions; a detecting device for detecting the temperature changes in the ions; a first ion source for the sample ions; a second ion source for the laser-cooled ions; and a third ion source for the probe ions. The probe ions may be different ions than the laser-cooled ions, or the probe ions may be the same ions as the laser-cooled ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.