Apparatus and method for examining the shape of gemstones
US6567156B1 · kind B1 · utility
34Cited by
22References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 31, 2000 |
| Grant date | May 20, 2003 |
| Priority date | — |
| Expiry date | Jun 14, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/87
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for examining a gemstone includes the steps of coating the gemstone with a removable diffusing coating and determining the silhouette of the gemstone in three dimensions. The method further includes performing structured light triangulation by using laser light to obtain an image of the surface of the gemstone, the gemstone being transparent and/or reflective to the laser light in the absence of the coating. The method further includes the step of using the silhouette in conjunction with the image to determine the location of any recesses on the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.