Patent · US Expired

Method and device for verification of VLSI designs

US6567959B2 · kind B2 · utility

11Cited by
22References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 30, 2001
Grant dateMay 20, 2003
Priority date
Expiry dateApr 25, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3323
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a formal equivalence verification method and system to determine the compatibility, or nonsimilarity, of two or more circuit designs. The method and system can check the corresponding verification nodes or candidates for cut points while accounting for input vectors including environmental conditions. The method and system may produce an answer for the user to indicate, for example, compatibility or disimilarity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.