Patent · US Expired

Method and apparatus for high-throughput chemical screening

US6572828B1 · kind B1 · utility

31Cited by
25References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 3, 2000
Grant dateJun 3, 2003
Priority date
Expiry dateMar 12, 2021

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB01L2300/1805
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

The present invention is directed to a method and apparatus for rapid screening of potential reactants, catalysts, or associated process conditions. In one embodiment, the method includes the steps of providing a reaction substrate having at least one substrate reservoir and introducing a reactant system at least partially embodied in a liquid into the substrate reservoirs. The reactant system is heated to at least one predetermined temperature. A flow of inert gas is provided through a manifold above the substrate reservoir. The reaction in the substrate reservoir can be monitored, e.g., visually or spectrophotometrically during the course of the reaction, or the reaction substrate block can be rapidly cooled to stop the reaction in the substrate reservoir prior to analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.