Patent · US Expired

Error correcting latch

US6573774B1 · kind B1 · utility

21Cited by
7References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 25, 2002
Grant dateJun 3, 2003
Priority date
Expiry dateMar 25, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K3/0375
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

An error-correcting partial latch stage includes a first pass gate having an input for receiving a data input signal, an output, and a control node for receiving a control signal, a second pass gate having an input coupled to the output of the first pass gate, an output for providing a data output signal, and a control node for receiving the control signal, an inverter having an input coupled to the output of the first pass gate and an output; and a correcting inverter stage having a first input coupled to the output of the inverter, and second and third inputs for receiving voting signals from adjacent error-correcting latch stages, and an output coupled to the output of the second pass gate. A full latch stage includes three interconnected partial latch stages. The full latch stage has a high degree of immunity from SEU events and from on-chip noise coupling.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.