Clustered backface culling
US6573895B1 · kind B1 · utility
7Cited by
4References
53Claims
0Family size
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Key dates
| Filing date | Apr 17, 2000 |
| Grant date | Jun 3, 2003 |
| Priority date | — |
| Expiry date | Apr 17, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A backface culling technique for clusters of polygons, as well as a method for generating efficient clusters from a set of triangle strips. The cluster backface test is directly derived from the traditional single-polygon test, and has about the same complexity. Memory requirements are 40 bytes per test. The cluster backface tests may be arranged hierarchically, with frontface tests added for symmetry. Experiments show graphics performance improvements of up to 50% in terms of number of effective polygons rendered per second.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.