Optoelectronic system using spatiochromatic triangulation
US6573998B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 1, 1999 |
| Grant date | Jun 3, 2003 |
| Priority date | — |
| Expiry date | Nov 1, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In accordance with the teachings of the present invention, an optoelectronic system (10) is provided for surface digitization of an object using spatiochromatic triangulation. The optoelectronic system (10) includes an illuminating subsystem (12) for illuminating a measuring space (30) that contains an object (16) to be measured, as well as a viewing subsystem (14) for collecting the light reflected by this object (16) and for generating a three-dimensional topography of the object (16) using in depth chromatic coding of the object. More specifically, relay optics (22) are used to image a polychromatic light source (20) onto a source slit (24) which in turn passes images from the slit image onto a dispersing element (26). The object to be measure is illuminated with a continuum of monochromatic images along a cutting, plane (x,z) within the measuring space (30). A color coded (x, &lgr;) representation, generated by the intersection of the cutting plane (32) and the surface of the measured object (16), is imaged onto a viewing slit of an imaging spectrograph. A relay lens (50) is used for projecting this image onto the viewing slit (42). A grayscale imaging array (46) located in the…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.