Method of overflow-based defect management representation
US6574723B2 · kind B2 · utility
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11Claims
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Key dates
| Filing date | May 18, 2001 |
| Grant date | Jun 3, 2003 |
| Priority date | — |
| Expiry date | Jul 24, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of storing values that involves splitting each value into a n-bit value and an overflow value, and storing, in a main table, the n-bit values in order of increasing magnitude of the values. For each overflow value, the position of the smallest n-bit value is stored in an overflow table. To retrieve a value, the position of the corresponding n-bit value is compared to the positions stored in the overflow value to determine the overflow value of the n-bit value. The actual value is then obtained from the n-bit value and its overflow value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.