Patent · US Expired

Method and apparatus for measuring optical aberrations of an eye

US6575572B2 · kind B2 · utility

48Cited by
13References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 21, 2001
Grant dateJun 10, 2003
Priority date
Expiry dateDec 22, 2021

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B3/156
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

Embodiments of the present invention provide a method and apparatus for measurement of aberration of an eye. One or more embodiments provide an aberration measurement instrument that enables measurement wherein Hartmann-Shack spots have reduced speckle; one or more embodiments provide an aberration measurement instrument that enables measurement of an eye having a large diopter power variation over different zones of the eye; one or more embodiments provide an aberration measurement instrument that enables measurement with accommodation control; one or more embodiment provide an aberration measurement instrument wherein radiation reflected by a cornea and radiation scattered by intra-ocular elements are blocked; and one or more embodiment provide an aberration measurement instrument wherein a hazy background produced by radiation multiply scattered within an eye is reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.