Unit with inspection probe blocks mounted thereon in parallel
US6577145B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 7, 2001 |
| Grant date | Jun 10, 2003 |
| Priority date | — |
| Expiry date | Nov 7, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07364
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A unit has inspection block blocks mounted thereon in parallel, wherein a plurality of inspection probe blocks are inserted into and removed from a guide rail through a slider so that the probe blocks can be loaded or replaced. Each probe block is slidingly moved along the guide rail so that its positional adjustment can be made in an extension length of the guide rail. Only one kind of support base can commonly be used by inserting and removing different probe blocks with respect to the support base and the positional adjustment can be done. The unit with inspection probe blocks mounted thereon in parallel includes a support base and a plurality of inspection probe blocks each having a plurality of blocks and arranged on the support base in parallel. The probes of each inspection probe block are contacted with electrodes of a display panel or wiring circuit board so that inspection can be carried out, wherein a guide rail is disposed on the support base, the inspection probe blocks are slidably fitted to the guide rail through a slider, and each inspection probe block is fixed to the support base at a predetermined slide position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.