Achromatic optical interferometer with continuously adjustable sensitivity
US6577403B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 13, 2000 |
| Grant date | Jun 10, 2003 |
| Priority date | — |
| Expiry date | Jan 22, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/0215
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a process for analyzing the wavefront of a light beam, a diffraction grating with rectangular meshing is placed in a plane perpendicular to the light beam to be analyzed and optically conjugate with the analysis plane. Different emergent beams from the grating interfere to form an image whose deformations are related to the slopes of the wavefront analyzed. The grating multiplies an intensity function, implemented by a two-dimensional intensity grating, which defines a rectangular meshing of sub-pupils transmitting the light from the beam to be analyzed into a plurality of emergent beams disposed in accordance with a rectangular meshing, with a phase function implemented by a two-dimension phase grating which introduces a phase shift between two adjacent emergent beams such that the two emergent beams are in phase opposition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.