Digital Component test Apparatus, an apparatus for testing electronic assemblies and a method for remotely testing a peripheral device having an electronic assembly
US6578167B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 6, 1999 |
| Grant date | Jun 10, 2003 |
| Priority date | — |
| Expiry date | Aug 6, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/875
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A digital component test apparatus is provided. The apparatus includes a network environment, a client computer, a server computer, a device and an application program. The client computer is operatively connected with the network environment. The server computer is operatively connected with the network environment. The device has an electronic assembly and an interface port. The interface port is configured to connect the client computer with the electronic assembly. The application program is transferred from the network server to the client computer via the network. The application program includes a boundary scan test procedure operative to test operation of the electronic assembly. A method for remotely testing a peripheral device having an electronic assembly is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.