Patent · US Expired

Method of crystal growth and resulted structures

US6579359B1 · kind B1 · utility

37Cited by
4References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 2, 2000
Grant dateJun 17, 2003
Priority date
Expiry dateJun 2, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02658
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method is disclosed for fabricating monocrystal material with the bandgap width exceeding 1.8 eV. The method comprises the steps of processing a monocrystal semiconductor wafer to develop a porous layer through electrolytic treatment of the wafer at direct current under UV-illumination, and epitaxially growing a monocrystal layer on said porous layer. Growth on porous layer produces semiconductor material with reduced stress and better characteristics than with the same material grown on non-porous layers and substrates. Also, semiconductor device structure comprising at least one layer of porous group III material is included.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.