Patent · US Expired

Apparatus and method for etching wafer backside

US6579408B1 · kind B1 · utility

1Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 22, 2002
Grant dateJun 17, 2003
Priority date
Expiry dateApr 22, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30604
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus and a method for mounting a wafer and etching a wafer backside in an etchant solution are provided. The apparatus is constructed by a first circular disc that has a first sidewall integrally formed, a gas inlet in the first circular disc or the first sidewall, a second circular disc that has a second sidewall integrally formed for positioning inside the first circular disc and forming a first cavity therein between, a third circular disc that has a third sidewall integrally formed for positioning inside the second circular disc and forming a second cavity therein between, a gas outlet in the second circular disc for withdrawing air from the second cavity, and sealing means positioned on top of the sidewalls for providing a substantially sealed second cavity when a wafer is positioned on top of the sidewalls.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.