Method and device for measuring the position of a metal strip
US6580262B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 13, 2000 |
| Grant date | Jun 17, 2003 |
| Priority date | — |
| Expiry date | Jan 13, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/2403
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inductively measuring the position of a metal strip is proposed, in which, at least on one side of the strip, a primary coil fed by AC voltage is arranged on one side of a strip edge and a secondary coil is arranged on the other side of the strip edge, which secondary coil measures the voltage which is induced by the primary coil and results from the coupling effect with the primary coil and the metal strip situated in between, in which, as a result of lateral relative movement between the metal strip and the primary and secondary coils, the measurement gradient that can be obtained as a result is determined and compared with a predetermined optimum measurement gradient, whereupon, in the event of a difference, the measurement gradient that has been ascertained is matched electronically to the predetermined optimum measurement gradient and the adapted values then obtained are used for the current strip movement control. This method can also be used for capacitively measuring the position of a metal strip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.