Thin film delamination detection for magnetic disks
US6580266B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2001 |
| Grant date | Jun 17, 2003 |
| Priority date | — |
| Expiry date | Nov 2, 2021 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/47
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.