Patent · US Expired

Cell architecture to reduce customization in a semiconductor device

US6580289B2 · kind B2 · utility

274Cited by
13References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 6, 2002
Grant dateJun 17, 2003
Priority date
Expiry dateJun 6, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/17796
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device and method of testing the device having a plurality of logic cells interconnected using vias to connect routing tracks that are disposed among a plurality of layers in the device. The logic cells in the device including at least two three-input look-up tables, one two-input look-up table and a flip-flop. The components in the logic cell are connected so that any look-up table can drive at least one input of any other look-up table and where the flip-flop is connected to the look-up tables so that any look-up table can drive an input of the flip-flop.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.