Patent · US Expired

Diagnostic method for KVLQT1—a long QT syndrome gene

US6582913B1 · kind B1 · utility

4Cited by
0References
16Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJun 19, 2000
Grant dateJun 24, 2003
Priority date
Expiry dateJun 19, 2020

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC12Q2600/172
  • WIPO fieldPharmaceuticals
  • WIPO sectorChemistry

Abstract

The genomic structure including the sequence of the intron/exon junctions is disclosed for KVLQT1 and KCNE1 which are genes associated with long QT syndrome. Additional sequence data for the two genes ARE also disclosed. Also disclosed are newly found mutations in KVLQT1 which result in long QT syndrome. The intron/exon junction sequence data allow for the design of primer pairs to amplify and sequence across all of the exons of the two genes. This can be used to screen persons for the presence of mutations which cause long QT syndrome. Assays can be performed to screen persons for the presence of mutations in either the DNA or proteins. The DNA and proteins may also be used in assays to screen for drugs which will be useful in treating or preventing the occurrence of long QT syndrome.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.