Patent · US Expired

Modulation method and apparatus for thermally analyzing a material

US6583391B2 · kind B2 · utility

11Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 31, 2001
Grant dateJun 24, 2003
Priority date
Expiry dateDec 15, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/4833
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample (7) and a heat source (1) and evaluating a functional relation between the measured heat flow (HF) and an associated temperature is based on controlling the heating power of the heat source (1) so as to cause the heat source to follow a temperature program (17) as a function of time superposed with a modulation (23) of the heating power.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.