Patent · US Expired

Temperature-measurement device with diffractive optics

US6585409B2 · kind B2 · utility

8Cited by

16References

2Claims

0Family size

Assignee

Raytek GmbH · US

Inventors

Volker Schmidt · Lexington, US
William Menchine · Santa Cruz, US
Hans-Jurgen Rostalski · Oberkochen, DE
Frank Wyrowski · Jena, DE

Key dates

Filing date	Oct 27, 2001
Grant date	Jul 1, 2003
Priority date	—
Expiry date	Oct 27, 2021

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S33/21
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for temperature measurement uses an optical system to image the heat radiation emanating from a measurement spot on an object of measurement onto a detector. A sighting arrangement is also provided which has a diffractive optical system by which a light intensity distribution is produced which corresponds to the position and size of the measurement spot on the object of measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.