Patent · US Expired

Method for detecting an element in a sample

US6586735B1 · kind B1 · utility

2Cited by

6References

10Claims

0Family size

Assignee

DEUTSCHES KREBSFORSCHUNGSZENTRUM STIFTUNG DES ÖFFENTLICHEN RECHTS · DE

Inventors

Ansgar Haking · Eppelheim, DE
Karsten Richter · Ketsch, DE

Key dates

Filing date	Jan 3, 2000
Grant date	Jul 1, 2003
Priority date	—
Expiry date	Jan 3, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01N23/06
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for detecting an element in a sample using a transmission electron microscope to measure a first image of the intensities of the sample at an energy loss in the range of the element signal. The background at various points is determined in a comparator sample which does not contain the element intensity. Energy loss is determined at the front of the element signal, and an energy loss is determined in the range of the element signal. From these values an approximation function is calculated so that an image of the pure element-specific intensities can be calculated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.