Patent · US Expired

Integrated circuit device with covalently bonded connection structure

US6586843B2 · kind B2 · utility

18Cited by
11References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 8, 2001
Grant dateJul 1, 2003
Priority date
Expiry dateNov 8, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/30107
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus provides increased operative life for flip-chip devices that are produced from an integrated circuit formed with electrically conductive bumps bonded to a printed circuit board substrate. The bumps and the substrate are formed from similar materials that allow control of the degree of latency for each element and produce a covalently bonded laminate structure when the bumps and substrate are brought together. The covalently bonded structure decreases bump fatigue to lengthen the operative life of the flip-chip device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.