Patent · US Expired

Systems for detecting measuring inclusions

US6590200B1 · kind B1 · utility

2Cited by
13References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 1999
Grant dateJul 8, 2003
Priority date
Expiry dateApr 2, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/137
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to systems of methods of detecting and measuring inclusions in liquid metals. More particularly, non-metallic inclusions having a conductivity level different from the liquid metal melt are forced to migrate and are collected on a measurement surface using electromagnetic Lorentz forces. The inclusions and their concentrations are detected at the measurement surface using either an electrostatic detection system or an optical detection system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.