Physical property determination using surface enhanced raman emissions
US6590647B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 4, 2001 |
| Grant date | Jul 8, 2003 |
| Priority date | — |
| Expiry date | Jul 5, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of and apparatus for determining a physical property of a material. The method includes: attaching nanoparticles to a substrate; positioning the substrate near the material; illuminating the nanoparticles with photons having wavelengths that stimulate surface enhanced Raman emissions; detecting photons emitted as a result of the illumination; and determining said physical property of said material using said detected photons. The apparatus includes: a substrate; nanoparticles attached to the substrate; a light source, connected to the substrate, for illuminating the nanoparticles with photons having wavelengths that stimulate surface enhanced Raman emissions; a photodetector, connected to the substrate, for detecting photons emitted as a result of illumination of the nanoparticles; and a processor, connected to the photodetector, for determining a property of material near the nanoparticles from the detected photons. The inventive method and apparatus are particularly adapted for use in connection with hydrocarbon exploration and production activities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.