Patent · US Expired

Biometric score normalizer

US6591224B1 · kind B1 · utility

67Cited by
9References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 2000
Grant dateJul 8, 2003
Priority date
Expiry dateOct 8, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V40/58
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Method and apparatus for providing a standardized measure of accuracy of each biometric device in a biometric identity authentication system having multiple users. A statistical database includes continually updated values of false acceptance rate and false rejection rate for each combination of user, biometric device and biometric device comparison score. False acceptance rate data are accumulated each time a user successfully accesses the system, by comparing the user's currently obtained biometric data with stored templates of all other users of the same device. Each user is treated as an “impostor” with respect to the other users, and the probability of an impostor's obtaining each possible comparison score is computed with accumulated data each time a successful access is made to the system. The statistical database also contains a false rejection rate, accumulated during a test phase, for each combination of user, biometric device and biometric device comparison score.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.