Test efficient method of classifying image quality of an optical sensor using three categories of pixels
US6593961B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 30, 1998 |
| Grant date | Jul 15, 2003 |
| Priority date | — |
| Expiry date | Oct 30, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A multi-threshold optical binning method for classifying the image quality of an optical sensor is presented. In accordance with the invention, a sensor tester causes a sensor pixel image to be generated by a sensor under test. The sensor pixel image is comprised of a plurality of pixels, each represented by an associated quantized intensity level. The quantized intensity level of a pixel may fall into one of a first pixel class, a second pixel class, or a third pixel class, for example, a dark pixel class, a dim pixel class, and an acceptable pixel class. An image filter processes the sensor pixel image, filtering but all pixels that fall within the acceptable pixel class, to generate a defective pixel map. The defective pixel map includes those pixels which have a quantized intensity level that falls within the first and/or second pixel class but not the third pixel class.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.