Wavelength reference device
US6594022B1 · kind B1 · utility
27Cited by
3References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2000 |
| Grant date | Jul 15, 2003 |
| Priority date | — |
| Expiry date | Aug 23, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/18388
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A wavelength reference device for tuning a tunable Fabry-Perot filter and/or a tunable VCSEL to a desired frequency, where the device uses a Fizeau interferometer and a position sensitive detector, with the position sensitive detector being used to measure the location of the maximum reflected power from the interferometer, whereby to determine the wavelength of laser radiation for tuning the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.