Patent · US Expired

Microscope, especially laser scanning microscope with rotatable interference filters

US6594074B1 · kind B1 · utility

8Cited by

7References

8Claims

0Family size

Assignee

Carl Zeiss Jena GmbH · DE

Inventors

Ralf Wolleschensky · Jena, DE
Ulrich Simon · Kahla, DE
Michael Stock · Limburg, DE

Key dates

Filing date	Aug 4, 1999
Grant date	Jul 15, 2003
Priority date	—
Expiry date	Aug 4, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/06
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A microscope, especially a laser scanning microscope, with illumination over one wavelength and/or a plurality of wavelengths, wherein a controlling of the intensity of at least one wavelength is carried out by at least one rotatable interference filter which is arranged in the illumination beam path, wherein the at least one wavelength is at least partially reflected out of the illumination beam path and a plurality of filters for different wavelengths can be arranged one behind the other in the illumination beam path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.