Patent · US Expired

Method and apparatus for texture analysis and replicability determination

US6594391B1 · kind B1 · utility

18Cited by
2References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 3, 1999
Grant dateJul 15, 2003
Priority date
Expiry dateSep 3, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/42
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An image or other information signal having a texture is analyzed along perceptual dimensions such as directionality, symmetry, regularity and type of regularity. A wavelet decomposition or other type of filtering operation is first applied to the information signal, in order to generate oriented subbands. Texture-related features, e.g., coarse features, vertical edges, horizontal edges, corners, etc., are then extracted from the subbands. The extracted features are then used to characterize the above-noted perceptual dimensions of the texture. A classification process may subsequently be used to classify the texture as directional, symmetric, regular and/or having a particular regularity type, e.g., a small, medium or large regularity, based on comparison with established thresholds. Advantageously, the classification process can also be used to determine the replicability of the texture.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.