Method and apparatus for improved inspection and classification of attributes of a workpiece

US6594590B2 · kind B2 · utility

Assignee

• COE Newnes/McGehee, ULC · CA

Inventors

• Steve Woods · Salmon Arm, CA
• Michael McGuire · Pittsburgh, US
• Harry Ogloff · Salmon Arm, CA
• Zvonimr Skocic · Salmon Arm, CA
• Emeric Johnson · Salmon Arm, CA

Key dates

• Filing date: Jul 5, 2001
• Grant date: Jul 15, 2003
• Expiry date: Oct 4, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N23/18
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An apparatus for detecting the probable existence, location, and type of defects in a workpiece is described. The apparatus includes a sensor subsystem, an optimizer, a control subsystem, and a computer system having a processor and computer readable memory. The sensor subsystem senses a first section of the workpiece and produces signals corresponding to a physical characteristic of the workpiece. The computer system is configured to generate a workpiece model based on the signals produced by the sensor subsystem. In an alternate embodiment, a defect assembler can be provided to merge signals front a plurality of sensor subsystems. The defect assembler can also be configured to generate the workpiece data model. The optimizer is configured to generate workpiece segmentation recommendations based on the workpiece data model.